zephyr/tests/subsys
Alberto Escolar Piedras 414996f880 tests/subsys/fs/nvs: Fix flakiness due to not init'ed data
This test has been seen failing at random (though not often).
A valgrind check showed the nvs_ate structures were being
CRC'ed with not-initialized data, and checked later (assuming
the CRC would be different than a constant).
This maybe have been the cause of the test failures, so let's
initialize the whole structure to prevent the CRC value
from depending on random memory/stack content.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2025-02-27 13:28:12 +00:00
..
bindesc
canbus/isotp
debug
dfu
display/cfb/basic
dsp
edac
emul
fs tests/subsys/fs/nvs: Fix flakiness due to not init'ed data 2025-02-27 13:28:12 +00:00
input
ipc tests: tests should not enable mmu directly 2025-02-19 04:59:19 +01:00
jwt
llext llext: add inspection API test suite 2025-02-13 16:43:29 +01:00
logging
lorawan
mem_mgmt
mgmt
modbus
modem
nrfs
openthread
pm tests: pm: Test the SoC State Change Power Domain driver 2025-02-13 16:40:10 +01:00
portability tests: portability: cmsis: Add tests for CMSIS-RTOSv2 static cb 2025-02-14 03:13:35 +01:00
random/rng
rtio rtio: Correctly handle completion count wraps 2025-02-12 12:23:06 +01:00
sd
secure_storage/psa tests: secure_storage: add dependencies 2025-02-27 09:07:56 +00:00
sensing
settings tests: settings: Performance test for settings 2025-02-13 16:40:41 +01:00
settings_commit_prio
shell tests: shell_backend_uart: do not filter 2025-02-20 21:06:00 +01:00
sip_svc
storage
testsuite/fff_fake_contexts
tracing/tracing_api
usb
zbus