Andrew Boie 7d29f3b06e ztest: do teardown in main thread ... If the test exits from some APIs like ztest_test_pass(), ztest_test_skip(), or a test crashes out, the teardown function is never run. Fixes: #16329 Signed-off-by: Andrew Boie <andrew.p.boie@intel.com>		2019-12-18 11:17:33 -08:00
..
bluetooth	drivers: clock_control: nrf: Switch to single clock device	2019-12-17 14:38:19 +01:00
console
cpp	treewide: avoid use of unsupported C++ specifiers	2019-12-13 17:19:54 -06:00
debug	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
dfu	dfu/img_util: fix flash_sector_from_off	2019-12-09 16:03:21 +01:00
disk	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
fb
fs	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
jwt
logging	logging: fix warning of array subscript having type char	2019-12-13 13:24:39 -05:00
mgmt
net	net: stats: Fix RX traffic class time statistics update	2019-12-18 17:59:54 +02:00
power	power: policy: remove deep sleep states from residency policy	2019-12-03 14:46:15 -06:00
random
settings	settings: Moving initialization code to proper backend sources	2019-12-16 12:11:20 +01:00
shell	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
stats
storage
testsuite	ztest: do teardown in main thread	2019-12-18 11:17:33 -08:00
usb	usb: derive USB device Serial Number String from HWINFO	2019-12-18 11:12:28 +01:00
CMakeLists.txt
Kconfig