zephyr/samples/drivers/current_sensing
Anas Nashif 3c50f7aa12 tests: samples: remove duplicate filtering
We have many testcases doing filtering both on the architecture level
and the platform level, which is redundant. Also many testcases are
running the same test twice on the same SoC for no good reason, cleanup
the tests and cleanup the filtering.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-06-27 17:44:23 -04:00
..
src
Makefile
prj.conf
README
sample.yaml

This is a sample app to interface with
TI INA219 power monitor. The values
used in the app are for use on Adafruit's
breakout board
(https://www.adafruit.com/products/904).

This assumes the slave address is 0x40,
where A0 and A1 are all tied to ground.