zephyr/tests
Henrik Brix Andersen ce426f69f0 tests: drivers: dac: loopback: use internal loopback on the twr_ke18f
Enable internal DAC to ADC loopback on the NXP TWR-KE18F
board.

Increase the ADC sample time to 5 microseconds since there is no
buffer between the DAC and ADC.

Signed-off-by: Henrik Brix Andersen <henrik@brixandersen.dk>
2020-07-03 08:05:25 -04:00
..
application_development
arch
benchmarks benchmarks: timing_info: fix x86 cycles to nsec conversion 2020-07-02 20:51:12 -04:00
bluetooth mesh: Adjust config values to pass Transport test cases 2020-07-02 16:30:01 +03:00
boards
crypto
deprecated
drivers tests: drivers: dac: loopback: use internal loopback on the twr_ke18f 2020-07-03 08:05:25 -04:00
kernel
lib
misc/test_build
net
portability
posix
shell
subsys
unit Revert "tests: dlist to add a testcase and add some tags" 2020-07-02 14:40:20 -05:00
ztest