zephyr/samples/drivers/i2c_fujitsu_fram
Anas Nashif 3c50f7aa12 tests: samples: remove duplicate filtering
We have many testcases doing filtering both on the architecture level
and the platform level, which is redundant. Also many testcases are
running the same test twice on the same SoC for no good reason, cleanup
the tests and cleanup the filtering.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-06-27 17:44:23 -04:00
..
src samples: convert to using newly introduced integer sized types 2017-04-21 09:53:53 -05:00
Makefile
prj.conf
README
sample.yaml tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00

This is a sample app to read and write
the Fujitsu MB85RC256V FRAM chip via I2C
on the Quark SE Sensor Subsystem.

This assumes the slave address of FRAM is 0x50,
where A0, A1, and A2 are all tied to ground.