zephyr/tests
Peter Bigot 6ecfe3eba1 tests: i2c_slave_api: overhaul test implementation
Make the expected data buffers immutable to ensure that the test isn't
modifying them.

Improve clarity by using defines for the two devicetree nodes rather
than repeating the DT_INST() retrieval.

Clean up the naming and diagnostics to more clearly associate the
device label, I2C bus, and I2C address with either EEPROM instance 0
or 1.  Replace the base 1 numbering in some diagnostics.

Document why a device nominally on one bus is being accessed from
another bus.  Return error values from helper functions rather than
invoking ztest failure code so the calling context can provide a
better description of what went wrong.

Signed-off-by: Peter Bigot <peter.bigot@nordicsemi.no>
2020-08-13 11:49:12 +02:00
..
application_development
arch tests: arch: arm: add a test for no-multithreading case for Cortex-m 2020-08-07 13:06:04 +02:00
benchmarks
bluetooth Bluetooth: host: Perodic advertisement synchronization 2020-08-11 14:17:19 +02:00
boards
crypto
deprecated
drivers tests: i2c_slave_api: overhaul test implementation 2020-08-13 11:49:12 +02:00
kernel test: msgq: Add two corner cases in message queue 2020-08-11 19:32:52 +02:00
lib device: Apply driver_api/data attributes rename everywhere 2020-08-11 19:30:53 +02:00
misc/test_build tests: misc: back to whitelisting mcuboot test 2020-08-07 09:50:22 -04:00
net device: Apply driver_api/data attributes rename everywhere 2020-08-11 19:30:53 +02:00
portability
posix
shell
subsys test: logging: Add more test cases for log core 2020-08-12 17:08:15 -05:00
unit tests/unit/util: refactor to test in both C and C++ language environments 2020-08-12 16:39:37 -05:00
ztest