zephyr/tests
Youvedeep Singh ff5b3249f4 tests: aio: Change reference voltage for AIO
Change reference voltage for Analog comparator to Internal reference
voltage.

Currently AIO is using External reference voltage (Reference A) and
external reference is set at 3.3V. In this usecase both reference
Voltage and AIO IP are set at 3.3V. So rising edge interrupt behaviour
will be unpredictable.

So by changing internal reference voltage to Internal (set at 1.09V)
interrupt will be generated as soon as Voltage on I/P will exceed it.

Jira: ZEP-1927

Signed-off-by: Youvedeep Singh <youvedeep.singh@intel.com>
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-05-18 20:26:56 -04:00
..
benchmarks tests: use k_thread_create() 2017-05-11 20:24:22 -04:00
bluetooth Bluetooth: shell: Add GATT write cmd throughput measurement 2017-05-16 15:30:51 +03:00
booting/stub
compliance
crypto
drivers tests: aio: Change reference voltage for AIO 2017-05-18 20:26:56 -04:00
include
kernel misc: _char_out can be a static symbol 2017-05-18 12:41:56 -05:00
lib/json
net net: conn: Check UDP and TCP checksum before accepting packet 2017-05-18 10:53:39 +03:00
power tests: use k_thread_create() 2017-05-11 20:24:22 -04:00
subsys tests: use k_thread_create() 2017-05-11 20:24:22 -04:00
unit
ztest tests: use k_thread_create() 2017-05-11 20:24:22 -04:00
defaults.tc
Kconfig
Makefile
Makefile.test